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20071105081145.0 |
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|a 2006037298
|
020 |
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|a0521819342 (hbk.) :|cNT|4656
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020 |
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|a9780521819343 (hbk.)
|
035 |
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|a2006037298
|
035 |
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|a(OCoLC)ocm76167306
|
035 |
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|a(OCoLC)76167306
|
040 |
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|aTWNTU|cTWNTU|dTWNTU
|
041 |
|
|aeng
|
050 |
00
|
|aTK7871.852|b.H65 2007
|
082 |
14
|
|a621.3815/2|222
|
095 |
|
|aNTTU|bG|cE039403|d621.38152|eH758|pBOOK|fCHIPPER|zBOOK|m0|tDDC
|
100 |
1
|
|aHolt, D. B.
|
245 |
10
|
|aExtended defects in semiconductors :|belectronic properties, device effects and structures /|cD.B. Holt, B.G. Yacobi.
|
260 |
|
|aCambridge ;|aNew York :|bCambridge University Press,|c2007.
|
300 |
|
|axi, 631 p. :|bill. ;|c26 cm.
|
504 |
|
|aIncludes bibliographical references and index.
|
650 |
0
|
|aSemiconductors|xDefects.
|
700 |
1
|
|aYacobi, B. G.
|
809 |
|
|d621.38152|eH758|tDDC|pBOOK
|
856 |
41
|
|3Table of contents only|uhttp://www.loc.gov/catdir/toc/ecip074/2006037298.html
|
856 |
42
|
|3Publisher description|uhttp://www.loc.gov/catdir/enhancements/fy0703/2006037298-d.html
|
856 |
42
|
|3Contributor biographical information|uhttp://www.loc.gov/catdir/enhancements/fy0803/2006037298-b.html
|